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- 2011288314 contributor B12176400.
- 2011288314 contributor B12176401.
- 2011288314 contributor B12176399.
- 2011288314 created "c2009.".
- 2011288314 date "2009".
- 2011288314 date "c2009.".
- 2011288314 dateCopyrighted "c2009.".
- 2011288314 description "Includes bibliographical references and indexes.".
- 2011288314 extent "xiii, [3], 259 p. :".
- 2011288314 identifier "1605110809".
- 2011288314 identifier "9781605110806".
- 2011288314 identifier 2011288314-d.html.
- 2011288314 isPartOf "Materials Research Society symposia proceedings ; v. 1108.".
- 2011288314 isPartOf "Materials Research Society symposium proceedings ; v. 1108".
- 2011288314 issued "2009".
- 2011288314 issued "c2009.".
- 2011288314 language "eng".
- 2011288314 publisher "Warrendale, Pa. : Materials Research Society,".
- 2011288314 subject "Semiconductors Congresses.".
- 2011288314 subject "Semiconductors Defects Congresses.".
- 2011288314 subject "Semiconductors Reliability Congresses.".
- 2011288314 subject "TK7871.85 .S952 2008".
- 2011288314 title "Performance and reliability of semiconductor devices : symposium held November 30-December 3, 2008, Boston, Massachusetts, U.S.A. / editors, Michael Mastro ... [et al.].".
- 2011288314 type "text".