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- 2011290141 contributor B12178375.
- 2011290141 created "c2010.".
- 2011290141 date "2010".
- 2011290141 date "c2010.".
- 2011290141 dateCopyrighted "c2010.".
- 2011290141 description "Includes bibliographical references and index.".
- 2011290141 description "Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles.".
- 2011290141 extent "xii, 363 p. :".
- 2011290141 identifier "9789814277105".
- 2011290141 identifier "981427710X".
- 2011290141 issued "2010".
- 2011290141 issued "c2010.".
- 2011290141 language "eng".
- 2011290141 publisher "Hackensack, NJ. ; London : World Scientific,".
- 2011290141 subject "621.38152 22".
- 2011290141 subject "Compound semiconductors Effect of radiation on.".
- 2011290141 subject "Compound semiconductors Reliability.".
- 2011290141 subject "TK7871.99.C65 J64 2010".
- 2011290141 tableOfContents "Semiconductor fundamentals -- Transistor technologies -- Optoelectronics -- Reliability fundamentals -- Compound semiconductor reliability -- Optoelectronic device reliability -- Radiation environments -- Interactions of radiation with semiconductors -- Displacement damage in compound semiconductors -- Displacement damage in optoelectronic devices -- Radiation damage in optocouplers -- Effects from single particles.".
- 2011290141 title "Reliability and radiation effects in compound semiconductors / Allan Johnston.".
- 2011290141 type "text".