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- 2011290487 alternative "International Symposium on Precision Engineering Measurements and Instrumentation".
- 2011290487 contributor B12178761.
- 2011290487 contributor B12178762.
- 2011290487 contributor B12178763.
- 2011290487 created "c2010.".
- 2011290487 date "2010".
- 2011290487 date "c2010.".
- 2011290487 dateCopyrighted "c2010.".
- 2011290487 description "Includes bibliographical references and author index.".
- 2011290487 extent "3 v. (various pagings) :".
- 2011290487 identifier "0819479403".
- 2011290487 identifier "9780819479402".
- 2011290487 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7544".
- 2011290487 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7544.".
- 2011290487 issued "2010".
- 2011290487 issued "c2010.".
- 2011290487 language "eng".
- 2011290487 publisher "Bellingham, Wash. : SPIE,".
- 2011290487 subject "681/.25 23".
- 2011290487 subject "Laser interferometers Congresses.".
- 2011290487 subject "Measurement Congresses.".
- 2011290487 subject "Optical measurements Congresses.".
- 2011290487 subject "Physical measurements Congresses.".
- 2011290487 subject "QC367 .I585 2010".
- 2011290487 title "International Symposium on Precision Engineering Measurements and Instrumentation".
- 2011290487 title "Sixth International Symposium on Precision Engineering Measurements and Instrumentation : 8-11 August 2010, Hangzhou, China / Jiubin Tan, Xianfang Wen, editors ; sponsored by International Committee on Measurements and Instrumentation ... [et al.] ; organized by International Committee on Measurements and Instrumentation, Instrumentation Committee of CSM (China), Harbin Institute of Technology ; cooperating organizations, China Jiliang University (China), Hefei University of Technology (China), SPIE.".
- 2011290487 type "text".