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- 2011294341 contributor B12182727.
- 2011294341 contributor B12182728.
- 2011294341 contributor B12182729.
- 2011294341 created "c2009.".
- 2011294341 date "2009".
- 2011294341 date "c2009.".
- 2011294341 dateCopyrighted "c2009.".
- 2011294341 description "Includes bibliographical references and indexes.".
- 2011294341 extent "viii, 179 p. :".
- 2011294341 identifier "1605111287".
- 2011294341 identifier "9781605111285".
- 2011294341 identifier 2011294341-d.html.
- 2011294341 isPartOf "MRS proceedings ; v. 1155".
- 2011294341 isPartOf "Materials Research Society symposia proceedings v. 1155.".
- 2011294341 issued "2009".
- 2011294341 issued "c2009.".
- 2011294341 language "eng".
- 2011294341 publisher "Warrendale, Pa. : Materials Research Society,".
- 2011294341 subject "621.3815/28 23".
- 2011294341 subject "Gate array circuits Congresses.".
- 2011294341 subject "Metal oxide semiconductors Materials Congresses.".
- 2011294341 subject "Metal oxide semiconductors, Complementary Congresses.".
- 2011294341 subject "Silicides Congresses.".
- 2011294341 subject "TK7871.99.M44 C5725 2009".
- 2011294341 title "CMOS gate-stack scaling-- materials, interfaces and reliability implications : symposium held April 14-16, 2009, San Francisco, california, U.S.A. / editors, Alexander A. Demkov ... [et al.].".
- 2011294341 type "text".