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- 2011377262 contributor B12246201.
- 2011377262 created "c2009.".
- 2011377262 date "2009".
- 2011377262 date "c2009.".
- 2011377262 dateCopyrighted "c2009.".
- 2011377262 description "Includes bibliographical references and index.".
- 2011377262 description "Introduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan.".
- 2011377262 extent "xv, 624 p. :".
- 2011377262 identifier "0470455268".
- 2011377262 identifier "0471731722".
- 2011377262 identifier "9780470455265".
- 2011377262 identifier "9780471731726".
- 2011377262 identifier 2011377262-b.html.
- 2011377262 identifier 2011377262-d.html.
- 2011377262 identifier 2011377262-t.html.
- 2011377262 isPartOf "IEEE Press series on microelectronic systems".
- 2011377262 isPartOf "IEEE Press series on microelectronic systems.".
- 2011377262 issued "2009".
- 2011377262 issued "c2009.".
- 2011377262 language "eng".
- 2011377262 publisher "Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley,".
- 2011377262 subject "CMOS-Schaltung. swd".
- 2011377262 subject "Metal oxide semiconductors, Complementary Reliability.".
- 2011377262 subject "Schaltungsentwurf. swd".
- 2011377262 subject "TK7871.99.M44 R455 2009".
- 2011377262 tableOfContents "Introduction / Alvin W. Strong -- Dielectric characterization and reliability methodology / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Dielectric breakdown of gate oxides: physics and experiments / Ernest Y. Wu, Rolf-Peter Vollertsen, and Jordi Suñé -- Negative bias temperature instabilities in pMOSFET devices / Giuseppe LaRosa -- Hot carriers / Stewart E. Rauch, III -- Stress-induced voiding / Timothy D. Sullivan -- Electromigration / Timothy D. Sullivan.".
- 2011377262 title "Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].".
- 2011377262 type "text".