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- 2011377541 contributor B12246579.
- 2011377541 contributor B12246580.
- 2011377541 created "c2010.".
- 2011377541 date "2010".
- 2011377541 date "c2010.".
- 2011377541 dateCopyrighted "c2010.".
- 2011377541 description "Includes bibliographical references.".
- 2011377541 extent "1 v. (various pagings) :".
- 2011377541 identifier "0819482978 (pbk.)".
- 2011377541 identifier "9780819482976 (pbk.)".
- 2011377541 isPartOf "Proceedings of SPIE, 0277-786X ; 7801.".
- 2011377541 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7801.".
- 2011377541 issued "2010".
- 2011377541 issued "c2010.".
- 2011377541 language "eng".
- 2011377541 publisher "Bellingham, Wash. : SPIE,".
- 2011377541 subject "681/.41 23".
- 2011377541 subject "Laser interferometers Congresses.".
- 2011377541 subject "Measurement Congresses.".
- 2011377541 subject "Measuring instruments Design and construction Congresses.".
- 2011377541 subject "Optical instruments Design and construction Congresses.".
- 2011377541 subject "Optical measurements Congresses.".
- 2011377541 subject "QC367 .A3383 2007".
- 2011377541 title "Advances in metrology for x-ray and EUV optics III : 1-2 August 2010, San Diego, California, United States / Lahsen Assoufid, Peter Z. Takacs, Anand Krishna Asundi, editors ; sponsored and published by SPIE.".
- 2011377541 type "text".