Matches in Library of Congress for { <http://lccn.loc.gov/2011377968> ?p ?o. }
Showing items 1 to 23 of
23
with 100 items per page.
- 2011377968 contributor B12247130.
- 2011377968 contributor B12247131.
- 2011377968 created "c2011.".
- 2011377968 date "2011".
- 2011377968 date "c2011.".
- 2011377968 dateCopyrighted "c2011.".
- 2011377968 description "Includes bibliographical references.".
- 2011377968 extent "1 v. (various pagings) :".
- 2011377968 identifier "0819484652 (pbk.)".
- 2011377968 identifier "9780819484659 (pbk.)".
- 2011377968 isPartOf "Proceedings of SPIE, 0277-786X ; v. 7928".
- 2011377968 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 7928. 0277-786X".
- 2011377968 issued "2011".
- 2011377968 issued "c2011.".
- 2011377968 language "eng".
- 2011377968 publisher "Bellingham, Wash. : SPIE,".
- 2011377968 subject "621.381 23".
- 2011377968 subject "Microelectromechanical systems Reliability Congresses.".
- 2011377968 subject "Microelectromechanical systems Testing Congresses.".
- 2011377968 subject "Microelectronic packaging Congresses.".
- 2011377968 subject "TK7875 .R438 2011".
- 2011377968 title "Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices X : 24-25 January 2011, San Francisco, California, United States / Sonia Garcia-Blanco, Rajeshuni Ramesham, editors ; sponsored by SPIE ; cosponsored by INO (Canada), DALSA Corporation (Canada), [and], SET--Smart Equipment Technology (France).".
- 2011377968 type "text".