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- 2011499441 contributor B12364646.
- 2011499441 contributor B12364647.
- 2011499441 created "c2011.".
- 2011499441 date "2011".
- 2011499441 date "c2011.".
- 2011499441 dateCopyrighted "c2011.".
- 2011499441 description "Includes bibliographical references and index.".
- 2011499441 extent "1 v. (various pagings) :".
- 2011499441 identifier "0819486108 (pbk.)".
- 2011499441 identifier "9780819486103 (pbk.)".
- 2011499441 isPartOf "Proceedings of SPIE, 0277-786X ; v. 8036".
- 2011499441 issued "2011".
- 2011499441 issued "c2011.".
- 2011499441 language "eng".
- 2011499441 publisher "Bellingham, Wash. : SPIE,".
- 2011499441 subject "570.28/25 23".
- 2011499441 subject "QH212.S3 S32 2011".
- 2011499441 subject "Scanning electron microscopes Congresses.".
- 2011499441 title "Scanning microscopies 2011 : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences ; 26-28 April 2011, Orlando, Florida, United States / Michael T. Postek ... [et al.] editors ; sponsored ... by SPIE.".
- 2011499441 type "text".