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- 2011935996 contributor B12421211.
- 2011935996 contributor B12421212.
- 2011935996 created "2011.".
- 2011935996 date "2011".
- 2011935996 date "2011.".
- 2011935996 dateCopyrighted "2011.".
- 2011935996 description "Includes bibliographical references.".
- 2011935996 extent "xviii, 212 p. :".
- 2011935996 identifier "1441982965 (hbk.)".
- 2011935996 identifier "9781441982964 (hbk.)".
- 2011935996 issued "2011".
- 2011935996 issued "2011.".
- 2011935996 language "eng".
- 2011935996 publisher "New York ; London : Springer,".
- 2011935996 subject "Delay faults (Semiconductors)".
- 2011935996 subject "Integrated circuits Very large scale integration Defects.".
- 2011935996 subject "Integrated circuits Very large scale integration Testing.".
- 2011935996 subject "TK7874 .T4323 2011".
- 2011935996 title "Test and diagnosis for small-delay defects / Mohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty.".
- 2011935996 type "text".