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- 2012031209 contributor B12463312.
- 2012031209 contributor B12463313.
- 2012031209 created "c2013.".
- 2012031209 date "2012".
- 2012031209 date "c2013.".
- 2012031209 dateCopyrighted "c2013.".
- 2012031209 description "Includes bibliographical references and index.".
- 2012031209 extent "xix, 300 p. :".
- 2012031209 identifier "9781466500556 (hardback)".
- 2012031209 identifier 9781466500556.jpg.
- 2012031209 issued "2012".
- 2012031209 issued "c2013.".
- 2012031209 language "eng".
- 2012031209 publisher "Boca Raton : Taylor & Francis,".
- 2012031209 subject "621.3815/284 23".
- 2012031209 subject "Integrated circuits Fault tolerance.".
- 2012031209 subject "Metal oxide semiconductor field-effect transistors Reliability.".
- 2012031209 subject "Strains and stresses.".
- 2012031209 subject "TECHNOLOGY & ENGINEERING / Electronics / Circuits / General bisacsh.".
- 2012031209 subject "TECHNOLOGY & ENGINEERING / Electronics / Microelectronics bisacsh.".
- 2012031209 subject "TECHNOLOGY & ENGINEERING / Material Science bisacsh.".
- 2012031209 subject "TK7871.99.M44 M248 2012".
- 2012031209 title "Strain-engineered MOSFETs / C. K. Maiti, T. K. Maiti.".
- 2012031209 type "text".
