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- 2012285071 contributor B12487044.
- 2012285071 contributor B12487045.
- 2012285071 date "2013".
- 2012285071 description "Includes bibliographical references and index.".
- 2012285071 extent "xv, 605 pages :".
- 2012285071 identifier "007175427X (hbk. : alk. paper)".
- 2012285071 identifier "9780071754279 (hbk. : alk. paper)".
- 2012285071 identifier 2012285071-b.html.
- 2012285071 identifier 2012285071-d.html.
- 2012285071 issued "2013".
- 2012285071 language "eng".
- 2012285071 subject "621.38152 23".
- 2012285071 subject "Semiconductors Reliability.".
- 2012285071 subject "TK7871.85 .G28 2013".
- 2012285071 title "Semiconductor process reliability in practice / Zhenghao Gan, Ph.D., Waisum Wong, Ph.D., Juin J. Liou, Ph.D.".
- 2012285071 type "text".