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- 2012419560 alternative "19th Asian Test Symposium".
- 2012419560 alternative "ATS 2010".
- 2012419560 alternative "Asian Test Symposium".
- 2012419560 contributor B12589059.
- 2012419560 contributor B12589060.
- 2012419560 created "c2010.".
- 2012419560 date "2010".
- 2012419560 date "c2010.".
- 2012419560 dateCopyrighted "c2010.".
- 2012419560 description "Includes bibliographical references and author index.".
- 2012419560 extent "xviii, 453 p. :".
- 2012419560 identifier "0769542484".
- 2012419560 identifier "9780769542485".
- 2012419560 issued "2010".
- 2012419560 issued "c2010.".
- 2012419560 language "eng".
- 2012419560 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2012419560 subject "621.39/5 23".
- 2012419560 subject "Electronic circuits Testing Congresses.".
- 2012419560 subject "Electronic digital computers Circuits Testing Congresses.".
- 2012419560 subject "Fault-tolerant computing Congresses.".
- 2012419560 subject "TK7888.4 .A84 2010".
- 2012419560 title "19th Asian Test Symposium".
- 2012419560 title "ATS 2010".
- 2012419560 title "Asian Test Symposium".
- 2012419560 title "Proceedings : 2010 19th IEEE Asian Test Symposium : ATS 2010 : 1-4 December 2010, Shanghai, China / [sponsored by IEEE Computer Society Test Technology Council].".
- 2012419560 type "text".