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- 2012471852 contributor B12635443.
- 2012471852 contributor B12635444.
- 2012471852 contributor B12635445.
- 2012471852 created "c2012.".
- 2012471852 date "2012".
- 2012471852 date "c2012.".
- 2012471852 dateCopyrighted "c2012.".
- 2012471852 description "Includes bibliographical references and indexes.".
- 2012471852 extent "xiii, 195 p. :".
- 2012471852 identifier "160511409X".
- 2012471852 identifier "9781605114095".
- 2012471852 identifier 2012471852-d.html.
- 2012471852 identifier 2012471852-t.html.
- 2012471852 isPartOf "Materials Research Society symposia proceedings ; v. 1432.".
- 2012471852 isPartOf "Materials Research Society symposium proceedings ; v. 1432".
- 2012471852 issued "2012".
- 2012471852 issued "c2012.".
- 2012471852 language "eng".
- 2012471852 publisher "Warrendale, Pa. : Materials Research Society,".
- 2012471852 subject "Materials Reliability Congresses.".
- 2012471852 subject "Microelectronics Reliability Congresses.".
- 2012471852 subject "Semiconductors Materials Congresses.".
- 2012471852 subject "TK7871.85 .R443 2012".
- 2012471852 title "Reliability and materials issues of III-V and II-VI semiconductor optical and electrical devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A. / editors, Osamu Ueda ... [et al.].".
- 2012471852 type "text".