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- 2013370052 contributor B12784801.
- 2013370052 created "c2013.".
- 2013370052 date "2013".
- 2013370052 date "c2013.".
- 2013370052 dateCopyrighted "c2013.".
- 2013370052 description "Includes bibliographical references (p. 201-208) and index.".
- 2013370052 extent "xii, 211 p. :".
- 2013370052 identifier "3527411674 (pbk.)".
- 2013370052 identifier "9783527411672 (pbk.)".
- 2013370052 issued "2013".
- 2013370052 issued "c2013.".
- 2013370052 language "eng".
- 2013370052 publisher "Weinheim, Germany : Wiley-VCH,".
- 2013370052 subject "530.4275 23".
- 2013370052 subject "Optical measurements.".
- 2013370052 subject "QC176.84.O7 Q56 2013".
- 2013370052 subject "Thin films Measurement.".
- 2013370052 subject "Thin films Optical properties.".
- 2013370052 title "A practical guide to optical metrology for thin films / Michael Quinten.".
- 2013370052 type "text".