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- 65018216 contributor B1630740.
- 65018216 contributor B1630741.
- 65018216 created "[1965]".
- 65018216 date "1965".
- 65018216 date "[1965]".
- 65018216 dateCopyrighted "[1965]".
- 65018216 description "Includes bibliographical references.".
- 65018216 extent "236 p.".
- 65018216 isPartOf "ASTM special technical publication no. 384".
- 65018216 isPartOf "American Society for Testing and Materials. Special technical publication ; no. 384.".
- 65018216 issued "1965".
- 65018216 issued "[1965]".
- 65018216 language "eng".
- 65018216 publisher "Philadelphia, American Society for Testing and Materials".
- 65018216 subject "621.38152".
- 65018216 subject "Electronic apparatus and appliances Effect of radiation on.".
- 65018216 subject "Semiconductors Effect of radiation on.".
- 65018216 subject "TK7872.S4 J62 1964".
- 65018216 title "Radiation effects in electronics.".
- 65018216 type "text".