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- 68015547 contributor B1836814.
- 68015547 contributor B1836815.
- 68015547 created "[1968]".
- 68015547 date "1968".
- 68015547 date "[1968]".
- 68015547 dateCopyrighted "[1968]".
- 68015547 description "Includes bibliographies.".
- 68015547 extent "230 p.".
- 68015547 isPartOf "ASTM Special technical publication no. 436".
- 68015547 isPartOf "ASTM special technical publication ; 436.".
- 68015547 issued "1968".
- 68015547 issued "[1968]".
- 68015547 language "eng".
- 68015547 publisher "Philadelphia, American Society for Testing and Materials".
- 68015547 subject "669.9/5/0282".
- 68015547 subject "Electron microscopes.".
- 68015547 subject "Fractography.".
- 68015547 subject "TN690 .S896 1967".
- 68015547 title "Electron fractography; a symposium presented at the seventieth annual meeting, American Society for Testing and Materials, Boston, Mass., 25-30 June, 1967.".
- 68015547 type "text".