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- 68055574%2F%2Fr892 contributor B1864883.
- 68055574%2F%2Fr892 created "[1968]".
- 68055574%2F%2Fr892 date "1968".
- 68055574%2F%2Fr892 date "[1968]".
- 68055574%2F%2Fr892 dateCopyrighted "[1968]".
- 68055574%2F%2Fr892 extent "65 p.".
- 68055574%2F%2Fr892 issued "1968".
- 68055574%2F%2Fr892 issued "[1968]".
- 68055574%2F%2Fr892 language "eng".
- 68055574%2F%2Fr892 publisher "New York, American Elsevier Pub. Co.".
- 68055574%2F%2Fr892 subject "535/.4".
- 68055574%2F%2Fr892 subject "Interferometry.".
- 68055574%2F%2Fr892 subject "Microstructure.".
- 68055574%2F%2Fr892 subject "QC411 .T59 1968".
- 68055574%2F%2Fr892 subject "Surfaces (Technology)".
- 68055574%2F%2Fr892 title "Microstructures of surfaces, using interferometry [by] S. Tolansky.".
- 68055574%2F%2Fr892 type "text".