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- 72183835 contributor B2120767.
- 72183835 created "1970]".
- 72183835 date "1970".
- 72183835 date "1970]".
- 72183835 dateCopyrighted "1970]".
- 72183835 description "Includes bibliographical references.".
- 72183835 description "Thesis--Technological University, Eindhoven.".
- 72183835 extent "93 p.".
- 72183835 isPartOf "Philips research reports. Supplements, 1970 no. 6".
- 72183835 issued "1970".
- 72183835 issued "1970]".
- 72183835 language "eng".
- 72183835 publisher "[Eindhoven, The Netherlands, Philips Research Laboratories,".
- 72183835 subject "508/.1 s 548/.85".
- 72183835 subject "Crystals Defects.".
- 72183835 subject "Q1 .P472 1970, no. 6 QD939".
- 72183835 subject "Silica.".
- 72183835 subject "Silicon crystals Electric properties.".
- 72183835 title "Electrical behaviour of defects at a thermally oxidized silicon surface, by M. V. Whelan.".
- 72183835 type "text".