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- 73156179%2F%2Fr84 contributor B2278367.
- 73156179%2F%2Fr84 created "1972.".
- 73156179%2F%2Fr84 date "1972".
- 73156179%2F%2Fr84 date "1972.".
- 73156179%2F%2Fr84 dateCopyrighted "1972.".
- 73156179%2F%2Fr84 description "Bibliography: p. 333-334.".
- 73156179%2F%2Fr84 extent "345 p.".
- 73156179%2F%2Fr84 identifier "0408703539".
- 73156179%2F%2Fr84 issued "1972".
- 73156179%2F%2Fr84 issued "1972.".
- 73156179%2F%2Fr84 language "eng".
- 73156179%2F%2Fr84 publisher "London, Butterworths,".
- 73156179%2F%2Fr84 subject "621.381/73".
- 73156179%2F%2Fr84 subject "Integrated circuits Testing.".
- 73156179%2F%2Fr84 subject "TK7874 .J67 1972".
- 73156179%2F%2Fr84 title "Compatibility and testing of electronic components [by] C. E. Jowett.".
- 73156179%2F%2Fr84 type "text".