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- 74000348 contributor B2389555.
- 74000348 contributor B2389556.
- 74000348 contributor B2389557.
- 74000348 created "1974.".
- 74000348 date "1974".
- 74000348 date "1974.".
- 74000348 dateCopyrighted "1974.".
- 74000348 description "Includes bibliographical references.".
- 74000348 extent "viii, 463 p.".
- 74000348 identifier "044419536X".
- 74000348 issued "1974".
- 74000348 issued "1974.".
- 74000348 language "eng".
- 74000348 publisher "Lausanne, Elsevier Sequoia S.A.,".
- 74000348 subject "541/.3453".
- 74000348 subject "QC176.82 .I55 1973".
- 74000348 subject "Thin films Congresses.".
- 74000348 title "Ion beam surface layer analysis; proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by the National Science Foundation and the IBM Corporation. Edited by: James W. Mayer and James F. Ziegler.".
- 74000348 type "text".