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- 74013001 contributor B2402992.
- 74013001 contributor B2402993.
- 74013001 created "1974.".
- 74013001 date "1974".
- 74013001 date "1974.".
- 74013001 dateCopyrighted "1974.".
- 74013001 description "Bibliography: p. 11.".
- 74013001 extent "19 p.".
- 74013001 isPartOf "NBS special publication 400-6".
- 74013001 isPartOf "NBS special publication ; 400-6.".
- 74013001 isPartOf "Semiconductor measurement technology".
- 74013001 issued "1974".
- 74013001 issued "1974.".
- 74013001 language "eng".
- 74013001 publisher "[Washington] National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]".
- 74013001 subject "389/.08 s 621.381/73".
- 74013001 subject "Electronic apparatus and appliances Testing.".
- 74013001 subject "Integrated circuits Testing.".
- 74013001 subject "QC100 .U57 no. 400-6 TK7874".
- 74013001 title "Microelectronic test patterns: an overview [by] Martin G. Buehler.".
- 74013001 type "text".