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- 74022483%2F%2Fr92 contributor B2412644.
- 74022483%2F%2Fr92 contributor B2412645.
- 74022483%2F%2Fr92 contributor B2412646.
- 74022483%2F%2Fr92 created "[1975]".
- 74022483%2F%2Fr92 date "1975".
- 74022483%2F%2Fr92 date "[1975]".
- 74022483%2F%2Fr92 dateCopyrighted "[1975]".
- 74022483%2F%2Fr92 description "Includes bibliographical references and index.".
- 74022483%2F%2Fr92 extent "xiii, 474 p. :".
- 74022483%2F%2Fr92 identifier "0471790206".
- 74022483%2F%2Fr92 issued "1975".
- 74022483%2F%2Fr92 issued "[1975]".
- 74022483%2F%2Fr92 language "eng".
- 74022483%2F%2Fr92 publisher "New York : Wiley,".
- 74022483%2F%2Fr92 subject "535/.3325".
- 74022483%2F%2Fr92 subject "Electron microscopy.".
- 74022483%2F%2Fr92 subject "Microchemistry.".
- 74022483%2F%2Fr92 subject "Microprobe analysis.".
- 74022483%2F%2Fr92 subject "QH212.E4 S53 1975".
- 74022483%2F%2Fr92 title "Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.".
- 74022483%2F%2Fr92 type "text".