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- 74032449%2F%2Fr85 contributor B2421690.
- 74032449%2F%2Fr85 created "1975.".
- 74032449%2F%2Fr85 date "1975".
- 74032449%2F%2Fr85 date "1975.".
- 74032449%2F%2Fr85 dateCopyrighted "1975.".
- 74032449%2F%2Fr85 description "Bibliography: p. 186-187.".
- 74032449%2F%2Fr85 extent "viii, 191 p. :".
- 74032449%2F%2Fr85 identifier "0387911227".
- 74032449%2F%2Fr85 isPartOf "The Wykeham science series ; #33".
- 74032449%2F%2Fr85 issued "1975".
- 74032449%2F%2Fr85 issued "1975.".
- 74032449%2F%2Fr85 language "eng".
- 74032449%2F%2Fr85 publisher "London : Wykeham Publications ; New York : Springer-Verlag,".
- 74032449%2F%2Fr85 subject "502/.8".
- 74032449%2F%2Fr85 subject "Electron microscopy.".
- 74032449%2F%2Fr85 subject "QH212.E4 G62".
- 74032449%2F%2Fr85 title "Electron microscopy and analysis / P. J. Goodhew.".
- 74032449%2F%2Fr85 type "text".