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- 74185758%2F%2Fr84 contributor B2481999.
- 74185758%2F%2Fr84 created "1974.".
- 74185758%2F%2Fr84 date "1974".
- 74185758%2F%2Fr84 date "1974.".
- 74185758%2F%2Fr84 dateCopyrighted "1974.".
- 74185758%2F%2Fr84 description "Bibliography: p. [125]-126.".
- 74185758%2F%2Fr84 extent "[ix], 134 p. :".
- 74185758%2F%2Fr84 identifier "0220662215 :".
- 74185758%2F%2Fr84 issued "1974".
- 74185758%2F%2Fr84 issued "1974.".
- 74185758%2F%2Fr84 language "eng".
- 74185758%2F%2Fr84 publisher "London : Business Books,".
- 74185758%2F%2Fr84 subject "621.3815/2".
- 74185758%2F%2Fr84 subject "Semiconductors Testing.".
- 74185758%2F%2Fr84 subject "TK7871.85 .J68".
- 74185758%2F%2Fr84 title "Semiconductor devices : testing and evaluation / [by] C. E. Jowett.".
- 74185758%2F%2Fr84 type "text".