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- 75025615 contributor B2594916.
- 75025615 contributor B2594917.
- 75025615 created "c1975.".
- 75025615 date "1975".
- 75025615 date "c1975.".
- 75025615 dateCopyrighted "c1975.".
- 75025615 description "Bibliography: p. 131.".
- 75025615 extent "ix, 134 p. :".
- 75025615 identifier "0412137607.0412137704".
- 75025615 issued "1975".
- 75025615 issued "c1975.".
- 75025615 language "eng".
- 75025615 publisher "London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press,".
- 75025615 subject "548/.84".
- 75025615 subject "Crystals Defects.".
- 75025615 subject "Electron microscopy.".
- 75025615 subject "QD921 .L67".
- 75025615 title "Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.".
- 75025615 type "text".