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- 75306992 contributor B2639439.
- 75306992 created "1972.".
- 75306992 date "1972".
- 75306992 date "1972.".
- 75306992 dateCopyrighted "1972.".
- 75306992 description "Includes bibliographies.".
- 75306992 extent "[4], 91 p. :".
- 75306992 identifier "0333137914 :".
- 75306992 isPartOf "Electronic engineering series".
- 75306992 isPartOf "Macmillan engineering evaluations : student editions".
- 75306992 issued "1972".
- 75306992 issued "1972.".
- 75306992 language "eng".
- 75306992 publisher "London : Macmillan,".
- 75306992 subject "621.3815/1".
- 75306992 subject "Electronic apparatus and appliances Testing.".
- 75306992 subject "Integrated circuits Testing.".
- 75306992 subject "Semiconductors Testing.".
- 75306992 subject "TK7870 .E443 1972".
- 75306992 title "Electronic component testing / edited by W. F. Waller.".
- 75306992 type "text".