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- 75322217 contributor B2656776.
- 75322217 contributor B2656777.
- 75322217 created "1975.".
- 75322217 date "1975".
- 75322217 date "1975.".
- 75322217 dateCopyrighted "1975.".
- 75322217 description "Includes bibliographical references.".
- 75322217 extent "26 p. :".
- 75322217 isPartOf "NBS technical note ; 862".
- 75322217 isPartOf "NBS technical note ; 862.".
- 75322217 issued "1975".
- 75322217 issued "1975.".
- 75322217 language "eng".
- 75322217 publisher "[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 75322217 subject "389/.6/08 s 669/.95/028".
- 75322217 subject "Electron microscopy.".
- 75322217 subject "Ion bombardment.".
- 75322217 subject "Metallography.".
- 75322217 subject "Metals Fracture.".
- 75322217 subject "QC100 .U5753 no. 862 TN690".
- 75322217 subject "Sputtering (Physics)".
- 75322217 title "Application of ion beam milling to the characterization of cracks in metals / L. K. Ives, A. Harper, and A. W. Ruff.".
- 75322217 type "text".