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- 75601537%2F%2Fr863 contributor B2783831.
- 75601537%2F%2Fr863 contributor B2783832.
- 75601537%2F%2Fr863 created "[1969]".
- 75601537%2F%2Fr863 date "1969".
- 75601537%2F%2Fr863 date "[1969]".
- 75601537%2F%2Fr863 dateCopyrighted "[1969]".
- 75601537%2F%2Fr863 description "v. 1. Application of monolithic microcircuits, by W. C. Weger, et al.--v. 2. Failure mechanisms of monolithic microcircuits, by W. O. Shurtleff.--v. 3. Failure analysis of monolithic microcircuits, by W. L. Workman.--v. 4. Reliability assessment of monolithic microcircuits, by J. D. Adams, et al.".
- 75601537%2F%2Fr863 extent "4 v.".
- 75601537%2F%2Fr863 isPartOf "NASA CR-1346-1349".
- 75601537%2F%2Fr863 isPartOf "NASA contractor report ; NASA CR-1346-1349.".
- 75601537%2F%2Fr863 issued "1969".
- 75601537%2F%2Fr863 issued "[1969]".
- 75601537%2F%2Fr863 language "eng".
- 75601537%2F%2Fr863 publisher "[Washington] National Aeronautics and Space Administration; for sale by the Clearinghouse for Federal Scientific and Technical Information, Springfield, Va.".
- 75601537%2F%2Fr863 subject "621.3817/3".
- 75601537%2F%2Fr863 subject "Integrated circuits Reliability.".
- 75601537%2F%2Fr863 subject "TL521.3.C6 A3 no. 1346-1349".
- 75601537%2F%2Fr863 tableOfContents "v. 1. Application of monolithic microcircuits, by W. C. Weger, et al.--v. 2. Failure mechanisms of monolithic microcircuits, by W. O. Shurtleff.--v. 3. Failure analysis of monolithic microcircuits, by W. L. Workman.--v. 4. Reliability assessment of monolithic microcircuits, by J. D. Adams, et al.".
- 75601537%2F%2Fr863 title "Reliability handbook for silicon monolithic microcircuits.".
- 75601537%2F%2Fr863 type "text".