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- 75619250 contributor B2788068.
- 75619250 contributor B2788069.
- 75619250 created "1976-".
- 75619250 date "1976".
- 75619250 date "1976-".
- 75619250 dateCopyrighted "1976-".
- 75619250 description "Includes bibliographical references.".
- 75619250 extent "v. :".
- 75619250 isPartOf "NBS special publication ; 422".
- 75619250 issued "1976".
- 75619250 issued "1976-".
- 75619250 language "eng".
- 75619250 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 75619250 subject "389/.08 s 543".
- 75619250 subject "Chemistry, Analytical Congresses.".
- 75619250 subject "QC100 .U57 no. 422 QD139.T7".
- 75619250 subject "Trace analysis Congresses.".
- 75619250 subject "Trace elements Congresses.".
- 75619250 subject "W3 MA425 1974a QD139.T7 M425 1974a".
- 75619250 title "Accuracy in trace analysis : sampling, sample handling, analysis : proceedings of the 7th Materials Research Symposium held at the National Bureau of Standards, Gaithersburg, Md., October 7-11, 1974 / Philip D. LaFleur, editor.".
- 75619250 type "text".