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- 75619388 contributor B2788237.
- 75619388 created "1976.".
- 75619388 date "1976".
- 75619388 date "1976.".
- 75619388 dateCopyrighted "1976.".
- 75619388 description "Includes bibliographical references.".
- 75619388 extent "v, 46 p. :".
- 75619388 isPartOf "NBS special publication ; 400-15".
- 75619388 isPartOf "NBS special publication ; 400-15.".
- 75619388 isPartOf "Semiconductor measurement technology".
- 75619388 issued "1976".
- 75619388 issued "1976.".
- 75619388 language "eng".
- 75619388 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 75619388 subject "602.1 s 621.381/73".
- 75619388 subject "Automatic data collection systems Congresses.".
- 75619388 subject "Electronic industries Quality control Congresses.".
- 75619388 subject "Integrated circuits Testing Congresses.".
- 75619388 subject "QC100 .U57 no. 400-15 TK7874".
- 75619388 title "ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor.".
- 75619388 type "text".