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- 75619425 contributor B2788276.
- 75619425 created "1976.".
- 75619425 date "1976".
- 75619425 date "1976.".
- 75619425 dateCopyrighted "1976.".
- 75619425 description "Includes bibliographical references.".
- 75619425 extent "vi, 44 p. :".
- 75619425 isPartOf "NBS special publication ; 400-18.".
- 75619425 isPartOf "National Bureau of Standards special publication ; 400-18".
- 75619425 isPartOf "Semiconductor measurement technology".
- 75619425 issued "1976".
- 75619425 issued "1976.".
- 75619425 language "eng".
- 75619425 publisher "[Washington] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 75619425 subject "602/.1 s 621.8/54/021".
- 75619425 subject "Aluminum wire Bonding.".
- 75619425 subject "Aluminum wire Testing.".
- 75619425 subject "QC100 .U57 no. 400-18 TK3307".
- 75619425 subject "Semiconductors Bonding.".
- 75619425 title "The Destructive bond pull test / John Albers, editor.".
- 75619425 type "text".