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- 76078439 contributor B2858593.
- 76078439 contributor B2858594.
- 76078439 created "[1969]".
- 76078439 date "1969".
- 76078439 date "[1969]".
- 76078439 dateCopyrighted "[1969]".
- 76078439 description "Includes bibliographies.".
- 76078439 extent "v, 235 p.".
- 76078439 identifier "0803100132".
- 76078439 isPartOf "ASTM special technical publication 453".
- 76078439 isPartOf "ASTM special technical publication ; 453.".
- 76078439 issued "1969".
- 76078439 issued "[1969]".
- 76078439 language "eng".
- 76078439 publisher "Philadelphia, American Society for Testing and Materials".
- 76078439 subject "620.1/6/6".
- 76078439 subject "Electron microscopy Congresses.".
- 76078439 subject "Fractography Congresses.".
- 76078439 subject "TA460 .S926 1968".
- 76078439 title "Electron microfractography; a symposium presented at the seventy-first annual meeting, American Society for Testing and Materials.".
- 76078439 type "text".