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- 76372967 contributor B2903929.
- 76372967 created "1976.".
- 76372967 date "1976".
- 76372967 date "1976.".
- 76372967 dateCopyrighted "1976.".
- 76372967 description "Includes bibliographical references.".
- 76372967 extent "xii, 216 p. :".
- 76372967 identifier "044441438X (American Elsevier) :".
- 76372967 isPartOf "Methods and phenomena, their applications in science and technology ; v. 2".
- 76372967 issued "1976".
- 76372967 issued "1976.".
- 76372967 language "eng".
- 76372967 publisher "Amsterdam ; New York : Elsevier Scientific Pub. Co.,".
- 76372967 subject "530.4/1".
- 76372967 subject "Epitaxy.".
- 76372967 subject "QC176.83 .C48".
- 76372967 subject "Semiconductors.".
- 76372967 subject "Thin films.".
- 76372967 title "Characterization of epitaxial semiconductor films / edited by Henry Kressel.".
- 76372967 type "text".