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- 76608043 contributor B2992575.
- 76608043 contributor B2992576.
- 76608043 created "1976.".
- 76608043 date "1976".
- 76608043 date "1976.".
- 76608043 dateCopyrighted "1976.".
- 76608043 description "Includes bibliographical references and index.".
- 76608043 extent "vii, 239 p. :".
- 76608043 isPartOf "NBS special publication ; 400-23".
- 76608043 isPartOf "NBS special publication ; 400-23.".
- 76608043 isPartOf "Semiconductor measurement technology".
- 76608043 issued "1976".
- 76608043 issued "1976.".
- 76608043 language "eng".
- 76608043 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards ; [for sale by the Supt. of Docs., Govt. Print. Off.],".
- 76608043 subject "602/.1 s 621.3815/2".
- 76608043 subject "QC100 .U57 no. 400-23 TK7871.85".
- 76608043 subject "Semiconductors Testing Congresses.".
- 76608043 subject "Silicon Testing Congresses.".
- 76608043 subject "Spectrum analysis Congresses.".
- 76608043 subject "Surfaces (Technology) Analysis Congresses.".
- 76608043 title "ARPA/NBS workshop IV : surface analysis for silicon devices / [edited by] A. George Lieberman.".
- 76608043 type "text".