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- 76608229 contributor B2992777.
- 76608229 contributor B2992778.
- 76608229 created "1977.".
- 76608229 date "1977".
- 76608229 date "1977.".
- 76608229 dateCopyrighted "1977.".
- 76608229 description "Includes bibliographical references.".
- 76608229 extent "xiv, 105 p. :".
- 76608229 isPartOf "NBS special publication ; 400-31.".
- 76608229 isPartOf "National Bureau of Standards special publication ; 400-31".
- 76608229 isPartOf "Semiconductor measurement technology".
- 76608229 issued "1977".
- 76608229 issued "1977.".
- 76608229 language "eng".
- 76608229 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 76608229 subject "602/.1 s 621.381/73".
- 76608229 subject "Integrated circuits Passivation.".
- 76608229 subject "Microelectronics Quality control.".
- 76608229 subject "Protective coatings Testing.".
- 76608229 subject "QC100 .U57 no. 400-31 TK7874".
- 76608229 title "Techniques for measuring the integrity of passivation overcoats on integrated circuits / Werner Kern and Robert B. Comizzoli.".
- 76608229 type "text".