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- 77608011 contributor B3219528.
- 77608011 contributor B3219529.
- 77608011 created "1977.".
- 77608011 date "1977".
- 77608011 date "1977.".
- 77608011 dateCopyrighted "1977.".
- 77608011 description "Includes bibliographical references.".
- 77608011 extent "iv, 48 p. :".
- 77608011 isPartOf "NBS special publication ; 400-35".
- 77608011 isPartOf "NBS special publication ; 400-35.".
- 77608011 isPartOf "Semiconductor measurement technology".
- 77608011 issued "1977".
- 77608011 issued "1977.".
- 77608011 language "eng".
- 77608011 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Doc., U.S. Govt. Print. Off.,".
- 77608011 subject "602/.1 s 621.381/71/028".
- 77608011 subject "Miniature electronic equipment Testing.".
- 77608011 subject "QC100 .U57 no. 400-35 TK7874".
- 77608011 subject "Scanning electron microscopy.".
- 77608011 subject "Semiconductors Testing.".
- 77608011 title "Notes on SEM examination of microelectronic devices / John R. Devaney, K. O. Leedy, and W. J. Keery.".
- 77608011 type "text".