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- 77608172 contributor B3219772.
- 77608172 created "1977.".
- 77608172 date "1977".
- 77608172 date "1977.".
- 77608172 dateCopyrighted "1977.".
- 77608172 description "Includes bibliographical references.".
- 77608172 extent "iii, 14 p. :".
- 77608172 isPartOf "NBS special publication ; 400-44".
- 77608172 isPartOf "NBS special publication ; 400-44.".
- 77608172 isPartOf "Semiconductor measurement technology".
- 77608172 issued "1977".
- 77608172 issued "1977.".
- 77608172 language "eng".
- 77608172 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 77608172 subject "602/.1 s 621.31/7".
- 77608172 subject "Power transistors Testing.".
- 77608172 subject "QC100 .U57 no. 400-44 TK7871.92".
- 77608172 title "Safe operating area limits for power transistors / David L. Blackburn.".
- 77608172 type "text".