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- 77608178 contributor B3219778.
- 77608178 created "1977.".
- 77608178 date "1977".
- 77608178 date "1977.".
- 77608178 dateCopyrighted "1977.".
- 77608178 description "Includes bibliographical references.".
- 77608178 extent "vii, 49 p. :".
- 77608178 isPartOf "NBS special publication ; 400-40".
- 77608178 isPartOf "NBS special publication ; 400-40.".
- 77608178 isPartOf "Semiconductor measurement technology".
- 77608178 issued "1977".
- 77608178 issued "1977.".
- 77608178 language "eng".
- 77608178 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 77608178 subject "602/.1 s 621.3815/2/028".
- 77608178 subject "Electric capacity.".
- 77608178 subject "Electric conductivity.".
- 77608178 subject "Electric meters.".
- 77608178 subject "QC100 .U57 no. 400-40 TK7871.85".
- 77608178 subject "Semiconductors Testing.".
- 77608178 title "A 25-kV bias-isolation unit for 1-MHz capacitance and conductance measurements / Alvin M. Goodman.".
- 77608178 type "text".