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- 78105906 contributor B3306965.
- 78105906 contributor B3306966.
- 78105906 created "c1977.".
- 78105906 date "1977".
- 78105906 date "c1977.".
- 78105906 dateCopyrighted "c1977.".
- 78105906 description "Includes bibliographical references.".
- 78105906 extent "x, 198 p. :".
- 78105906 issued "1977".
- 78105906 issued "c1977.".
- 78105906 language "eng".
- 78105906 publisher "New York : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office,".
- 78105906 subject "621.3819/5833 19".
- 78105906 subject "Integrated circuits Large scale integration Congresses.".
- 78105906 subject "Integrated circuits Testing Congresses.".
- 78105906 subject "Microprocessors Testing Congresses.".
- 78105906 subject "Semiconductor storage devices Testing.".
- 78105906 subject "TK7874 .S42 1977".
- 78105906 title "Memory & LSI : digest of papers / 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey ; sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE.".
- 78105906 type "text".