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- 78606024 contributor B3455292.
- 78606024 contributor B3455293.
- 78606024 created "1978.".
- 78606024 date "1978".
- 78606024 date "1978.".
- 78606024 dateCopyrighted "1978.".
- 78606024 description "Includes bibliographical references.".
- 78606024 extent "vi, 83 p. :".
- 78606024 isPartOf "NBS special publication ; 400-32".
- 78606024 isPartOf "NBS special publication ; 400-32.".
- 78606024 isPartOf "Semiconductor measurement technology".
- 78606024 issued "1978".
- 78606024 issued "1978.".
- 78606024 language "eng".
- 78606024 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 78606024 subject "602/.1 s 621.381/73".
- 78606024 subject "QC100 .U57 no. 400-32 TK7871.85".
- 78606024 subject "Semiconductors Testing Equipment and supplies.".
- 78606024 title "Microelectronic test pattern NBS-4 / W. Robert Thurber and Martin G. Buehler.".
- 78606024 type "text".