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- 79100716%2F%2Fr85 contributor B3538068.
- 79100716%2F%2Fr85 contributor B3538069.
- 79100716%2F%2Fr85 created "1978.".
- 79100716%2F%2Fr85 date "1978".
- 79100716%2F%2Fr85 date "1978.".
- 79100716%2F%2Fr85 dateCopyrighted "1978.".
- 79100716%2F%2Fr85 description "Bibliography: p. 95-99.".
- 79100716%2F%2Fr85 extent "x, 104 p. :".
- 79100716%2F%2Fr85 issued "1978".
- 79100716%2F%2Fr85 issued "1978.".
- 79100716%2F%2Fr85 language "eng".
- 79100716%2F%2Fr85 publisher "Griffiss Air Force Base, N.Y. : Reliability Analysis Center,".
- 79100716%2F%2Fr85 subject "621.381/73/028".
- 79100716%2F%2Fr85 subject "Integrated circuits Reliability.".
- 79100716%2F%2Fr85 subject "Integrated circuits Testing.".
- 79100716%2F%2Fr85 subject "TK7874 .R54".
- 79100716%2F%2Fr85 title "Microcircuit screening effectiveness : technical reliability study / prepared by Henry C. Rickers.".
- 79100716%2F%2Fr85 type "text".