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- 79600131 contributor B3693021.
- 79600131 contributor B3693022.
- 79600131 created "1979.".
- 79600131 date "1979".
- 79600131 date "1979.".
- 79600131 dateCopyrighted "1979.".
- 79600131 description "Includes bibliographical references.".
- 79600131 extent "v, 66 p. :".
- 79600131 isPartOf "NBS special publication ; 400-59".
- 79600131 isPartOf "NBS special publication ; 400-59.".
- 79600131 isPartOf "Semiconductor measurement technology".
- 79600131 issued "1979".
- 79600131 issued "1979.".
- 79600131 language "eng".
- 79600131 publisher "Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 79600131 subject "602/.18 s 621.3815/2/0287 19".
- 79600131 subject "Acoustic emission testing.".
- 79600131 subject "Nondestructive testing.".
- 79600131 subject "QC100 .U57 no. 400-59 TK7871.85".
- 79600131 subject "Semiconductor industry Quality control.".
- 79600131 subject "Semiconductors Testing.".
- 79600131 title "Nondestructive tests used to insure the integrity of semiconductor devices with emphasis on acoustic emission techniques / George G. Harman ; sponsored in part by the Defense Advanced Research Projects Agency.".
- 79600131 type "text".