Matches in Library of Congress for { <http://lccn.loc.gov/79600194%2F%2Fr852> ?p ?o. }
Showing items 1 to 21 of
21
with 100 items per page.
- 79600194%2F%2Fr852 contributor B3693101.
- 79600194%2F%2Fr852 contributor B3693102.
- 79600194%2F%2Fr852 created "1980.".
- 79600194%2F%2Fr852 date "1980".
- 79600194%2F%2Fr852 date "1980.".
- 79600194%2F%2Fr852 dateCopyrighted "1980.".
- 79600194%2F%2Fr852 description "Includes bibliographical references.".
- 79600194%2F%2Fr852 extent "xvi, 361 p. :".
- 79600194%2F%2Fr852 isPartOf "NBS special publication ; 400-56".
- 79600194%2F%2Fr852 isPartOf "NBS special publication ; 400-56.".
- 79600194%2F%2Fr852 isPartOf "Semiconductor measurement technology".
- 79600194%2F%2Fr852 issued "1980".
- 79600194%2F%2Fr852 issued "1980.".
- 79600194%2F%2Fr852 language "eng".
- 79600194%2F%2Fr852 publisher "[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 79600194%2F%2Fr852 subject "602/.18 s 621.381/73/0287 19".
- 79600194%2F%2Fr852 subject "Integrated circuits Large scale integration.".
- 79600194%2F%2Fr852 subject "Integrated circuits Testing.".
- 79600194%2F%2Fr852 subject "QC100 .U57 no. 400-56 TK7874".
- 79600194%2F%2Fr852 title "Comprehensive test pattern and approach for characterizing SOS technology / W. E. Ham ; supported by the Defense Advanced Research Projects Agency.".
- 79600194%2F%2Fr852 type "text".