Matches in Library of Congress for { <http://lccn.loc.gov/79607012> ?p ?o. }
Showing items 1 to 20 of
20
with 100 items per page.
- 79607012 contributor B3698510.
- 79607012 contributor B3698511.
- 79607012 created "1979.".
- 79607012 date "1979".
- 79607012 date "1979.".
- 79607012 dateCopyrighted "1979.".
- 79607012 extent "vi, 65 p. :".
- 79607012 isPartOf "NBS special publication ; 400-48".
- 79607012 isPartOf "NBS special publication ; 400-48.".
- 79607012 issued "1979".
- 79607012 issued "1979.".
- 79607012 language "eng".
- 79607012 publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- 79607012 subject "602/.1 s 621.3815/2/028".
- 79607012 subject "Electric resistance, Spreading.".
- 79607012 subject "QC100 .U57 no. 400-48 TK7871.85".
- 79607012 subject "Semiconductors Testing.".
- 79607012 subject "Silicon Electric properties.".
- 79607012 title "Semiconductor measurement technology : spreading resistance analysis for silicon layers with nonuniform resistivity / David H. Dickey and James R. Ehrstein.".
- 79607012 type "text".