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- 80025156 contributor B3754957.
- 80025156 created "c1981.".
- 80025156 date "1981".
- 80025156 date "c1981.".
- 80025156 dateCopyrighted "c1981.".
- 80025156 description "Includes bibliographical refererences (p. 151-175) and index.".
- 80025156 extent "xv, 175 p. ;".
- 80025156 identifier "0677055900".
- 80025156 isPartOf "Electrocomponent science monographs ; v. 12".
- 80025156 issued "1981".
- 80025156 issued "c1981.".
- 80025156 language "eng".
- 80025156 publisher "New York : Gordon and Breach Science Publishers,".
- 80025156 subject "621.3815/2 19".
- 80025156 subject "Metal oxide semiconductors.".
- 80025156 subject "TK7871.99.M44 D38".
- 80025156 title "Instabilities in MOS devices / J. R. Davis.".
- 80025156 type "text".