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- 80083501 contributor B3776094.
- 80083501 contributor B3776095.
- 80083501 created "c1980.".
- 80083501 date "1980".
- 80083501 date "c1980.".
- 80083501 dateCopyrighted "c1980.".
- 80083501 description "Includes bibliographical references and index.".
- 80083501 extent "xv, 507 p. :".
- 80083501 issued "1980".
- 80083501 issued "c1980.".
- 80083501 language "eng".
- 80083501 publisher "New York, N.Y. : Institute of Electrical and Electronics Engineers ; Long Beach, Calif. : available from IEEE Computer Society Publications Office,".
- 80083501 subject "621.381/73/0287 19".
- 80083501 subject "Integrated circuits Testing Congresses.".
- 80083501 subject "TK7874 .T45 1980".
- 80083501 title "Testing for the 80's : digest of papers, 1980 Test Conference, November 11, 12, 13, 1980 / sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE.".
- 80083501 type "text".