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- 80144504%2F%2Fr85 contributor B3821093.
- 80144504%2F%2Fr85 contributor B3821094.
- 80144504%2F%2Fr85 created "1980.".
- 80144504%2F%2Fr85 date "1980".
- 80144504%2F%2Fr85 date "1980.".
- 80144504%2F%2Fr85 dateCopyrighted "1980.".
- 80144504%2F%2Fr85 extent "2 v. ;".
- 80144504%2F%2Fr85 isPartOf "Microcircuit device reliability ; MDR-15".
- 80144504%2F%2Fr85 issued "1980".
- 80144504%2F%2Fr85 issued "1980.".
- 80144504%2F%2Fr85 language "eng".
- 80144504%2F%2Fr85 publisher "Griffiss Air Force Base, NY : Reliability Analysis Center,".
- 80144504%2F%2Fr85 subject "621.381/73/0278 19".
- 80144504%2F%2Fr85 subject "Digital integrated circuits Reliability Tables.".
- 80144504%2F%2Fr85 subject "Digital integrated circuits Testing.".
- 80144504%2F%2Fr85 subject "TK7874 .N48".
- 80144504%2F%2Fr85 title "Digital evaluation and failure analysis data / prepared by David B. Nicholls, under contract to Rome Air Development Center.".
- 80144504%2F%2Fr85 type "text".