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- 80600197 contributor B3916013.
- 80600197 contributor B3916014.
- 80600197 contributor B3916015.
- 80600197 created "1981.".
- 80600197 date "1981".
- 80600197 date "1981.".
- 80600197 dateCopyrighted "1981.".
- 80600197 description "Includes bibliographical references.".
- 80600197 extent "iv, 49 p. :".
- 80600197 isPartOf "NBS special publication ; 400-65".
- 80600197 isPartOf "Semiconductor measurement technology".
- 80600197 issued "1981".
- 80600197 issued "1981.".
- 80600197 language "eng".
- 80600197 publisher "Washington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. G.P.O.,".
- 80600197 subject "621.381/73/0287 19".
- 80600197 subject "Electronic apparatus and appliances Testing.".
- 80600197 subject "Integrated circuits Testing.".
- 80600197 subject "QC100 .U57 no. 400-65 TK7874".
- 80600197 title "Test patterns NBS-28 and NBS-28A : random fault interconnect step coverage and other structures / Michael A. Mitchell, Loren W. Linholm sponsored by Naval Air Systems Command, Air Force Wright Aeronautical Laboratories.".
- 80600197 type "text".