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- 80607032 contributor B3920877.
- 80607032 created "c1981.".
- 80607032 date "1981".
- 80607032 date "c1981.".
- 80607032 dateCopyrighted "c1981.".
- 80607032 description "Includes bibliographical references and indexes.".
- 80607032 extent "xxiii, 578 p., [4] leaves of plates :".
- 80607032 identifier "0442232861".
- 80607032 issued "1981".
- 80607032 issued "c1981.".
- 80607032 language "eng".
- 80607032 publisher "New York : Van Nostrand Reinhold Co.,".
- 80607032 subject "543/.0812".
- 80607032 subject "Electron probe microanalysis.".
- 80607032 subject "QD98.E4 H44".
- 80607032 subject "X-ray spectroscopy.".
- 80607032 title "Electron beam x-ray microanalysis / Kurt F. J. Heinrich.".
- 80607032 type "text".