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- 81460467 contributor B4113695.
- 81460467 created "1978.".
- 81460467 date "1978".
- 81460467 date "1978.".
- 81460467 dateCopyrighted "1978.".
- 81460467 description "Includes bibliographies.".
- 81460467 extent "100 p. :".
- 81460467 isPartOf "Trudy Moskovskogo ėnergeticheskogo instituta ; vyp. 376".
- 81460467 isPartOf "Trudy Moskovskogo ordena Lenina ėnergeticheskogo instituta ; vyp. 376.".
- 81460467 issued "1978".
- 81460467 issued "1978.".
- 81460467 language "rus".
- 81460467 publisher "Moskva : MĖI,".
- 81460467 subject "Electronic industries Quality control.".
- 81460467 subject "Integrated circuits Testing.".
- 81460467 subject "Semiconductors Testing.".
- 81460467 subject "TJ7 .M63 vyp. 376 TK7836".
- 81460467 title "Voprosy kontroli︠a︡ integralʹnykh mikroskhem i poluprovodnikovykh priborov : Tematicheskiĭ sbornik / Red. V.P. Dʹi︠a︡konov.".
- 81460467 type "text".